toggle visibility Search & Display Options

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year Publication Volume (down) Pages Links
Zhao, G.; Hoffmann, H.; van Bussel, L.G.J.; Enders, A.; Specka, X.; Sosa, C.; Yeluripati, J.; Tao, F.L.; Constantin, J.; Raynal, H.; Teixeira, E.; Grosz, B.; Doro, L.; Zhao, Z.G.; Nendel, C.; Kiese, R.; Eckersten, H.; Haas, E.; Vanuytrecht, E.; Wang, E.; Kuhnert, M.; Trombi, G.; Moriondo, M.; Bindi, M.; Lewan, E.; Bach, M.; Kersebaum, K.C.; Rotter, R.; Roggero, P.P.; Wallach, D.; Cammarano, D.; Asseng, S.; Krauss, G.; Siebert, S.; Gaiser, T.; Ewert, F. Effect of weather data aggregation on regional crop simulation for different crops, production conditions, and response variables 2015 Climate Research 65 141-157 details   doi
Semenov, M.A.; Stratonovitch, P. Adapting wheat ideotypes for climate change: accounting for uncertainties in CMIP5 climate projections 2015 Climate Research 65 123-139 details   doi
Hoffmann, H.; Zhao, G.; van Bussel, L.G.J.; Enders, A.; Specka, X.; Sosa, C.; Yeluripati, J.; Tao, F.; Constantin, J.; Raynal, H.; Teixeira, E.; Grosz, B.; Doro, L.; Zhao, Z.; Wang, E.; Nendel, C.; Kersebaum, K.C.; Haas, E.; Kiese, R.; Klatt, S.; Eckersten, H.; Vanuytrecht, E.; Kuhnert, M.; Lewan, E.; Rötter, R.; Roggero, P.P.; Wallach, D.; Cammarano, D.; Asseng, S.; Krauss, G.; Siebert, S.; Gaiser, T.; Ewert, F. Variability of effects of spatial climate data aggregation on regional yield simulation by crop models 2015 Climate Research 65 53-69 details   doi
Semenov, M.A.; Pilkington-Bennett, S.; Calanca, P. Validation of ELPIS 1980-2010 baseline scenarios using the observed European Climate Assessment data set 2013 Climate Research 57 1-9 details   doi
Toscano, P.; Ranieri, R.; Matese, A.; Vaccari, F.P.; Gioli, B.; Zaldei, A.; Silvestri, M.; Ronchi, C.; La Cava, P.; Porter, J.R.; Miglietta, F. Durum wheat modeling: The Delphi system, 11 years of observations in Italy 2012 European Journal of Agronomy 43 108-118 details   doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: