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Montesino-San Martín, M.; Olesen, J.E.; Porter, J.R. Can crop-climate models be accurate and precise? A case study for wheat production in Denmark 2015 Agricultural and Forest Meteorology 202 51-60 details   doi
Jabloun, M.; Schelde, K.; Tao, F.; Olesen, J.E. Effect of temperature and precipitation on nitrate leaching from organic cereal cropping systems in Denmark 2015 European Journal of Agronomy 62 55-64 details   doi
Raymundo, R.; Asseng, S.; Prassad, R.; Kleinwechter, U.; Concha, J.; Condori, B.; Bowen, W.; Wolf, J.; Olesen, J.E.; Dong, Q.; Zotarelli, L.; Gastelo, M.; Alva, A.; Travasso, M.; Quiroz, R.; Arora, V.; Graham, W.; Porter, C. Performance of the SUBSTOR-potato model across contrasting growing conditions 2017 Field Crops Research 202 57-76 details   doi
Yin, X.; Olesen, J.E.; Wang, M.; Öztürk, I.; Zhang, H.; Chen, F. Impacts and adaptation of the cropping systems to climate change in the Northeast Farming Region of China 2016 European Journal of Agronomy 78 60-72 details   doi
Yin, X.G.; Kersebaum, K.C.; Kollas, C.; Manevski, K.; Baby, S.; Beaudoin, N.; Ozturk, I.; Gaiser, T.; Wu, L.H.; Hoffmann, M.; Charfeddine, M.; Conradt, T.; Constantin, J.; Ewert, F.; de Cortazar-Atauri, I.G.; Giglio, L.; Hlavinka, P.; Hoffmann, H.; Launay, M.; Louarn, G.; Manderscheid, R.; Mary, B.; Mirschel, W.; Nende, C.; Pacholskin, A.; Palosuo, T.; Ripoche-Wachter, D.; Rotter, R.P.; Ruget, F.; Sharif, B.; Trnka, M.; Ventrella, D.; Weigel, H.J.; Olesen, J.E.; Yin, X.; Kersebaum, K.C.; Kollas, C.; Manevski, K.; Baby, S.; Beaudoin, N.; Ozturk, I.; Gaiser, T.; Wu, L.; Hoffmann, M.; Charfeddine, M.; Conradt, T.; Constantin, J.; Ewert, F.; de Cortazar-Atauri, I.G.; Giglio, L.; Hlavinka, P.; Hoffmann, H.; Launay, M.; Louarn, G.; Manderscheid, R.; Mary, B.; Mirschel, W.; Nende, C.; Pacholskin, A.; Palosuo, T.; Ripoche-Wachter, D.; Roetter, R.P.; Ruget, F.; Sharif, B.; Trnka, M.; Ventrella, D.; Weigel, H.-J.; Olesen, J.E. Performance of process-based models for simulation of grain N in crop rotations across Europe 2017 Agricultural Systems 154 63-77 details   doi
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