Abstract: Genetic improvement of grain yield (GY) and grain protein concentration (GPC) is impeded by large genotype×environment×management interactions and by compensatory effects between traits. Here global uncertainty and sensitivity analyses of the process-based wheat model SiriusQuality2 were conducted with the aim of identifying candidate traits to increase GY and GPC. Three contrasted European sites were selected and simulations were performed using long-term weather data and two nitrogen (N) treatments in order to quantify the effect of parameter uncertainty on GY and GPC under variable environments. The overall influence of all 75 plant parameters of SiriusQuality2 was first analysed using the Morris method. Forty-one influential parameters were identified and their individual (first-order) and total effects on the model outputs were investigated using the extended Fourier amplitude sensitivity test. The overall effect of the parameters was dominated by their interactions with other parameters. Under high N supply, a few influential parameters with respect to GY were identified (e.g. radiation use efficiency, potential duration of grain filling, and phyllochron). However, under low N, >10 parameters showed similar effects on GY and GPC. All parameters had opposite effects on GY and GPC, but leaf and stem N storage capacity appeared as good candidate traits to change the intercept of the negative relationship between GY and GPC. This study provides a system analysis of traits determining GY and GPC under variable environments and delivers valuable information to prioritize model development and experimental work.

Abstract: AimTo derive location-specific parameters that reflect the geographic differences among cultivars in vernalization requirements, sensitivity to day length (photoperiod) and temperature, which can be used to simulate the phenological development of wheat and maize at the global scale. LocationGlobal. Methods Based on crop calendar observations and literature describing the large-scale patterns of phenological characteristics of cultivars, we developed algorithms to compute location-specific parameters to represent this large-scale pattern. Vernalization requirements were related to the duration and coldness of winter, sensitivity to day length was assumed to be represented by the minimum and maximum day lengths occurring at a location, and sensitivity to temperature was related to temperature conditions during the vegetative development phase of the crop. Results Application of the derived location-specific parameters resulted in high agreement between simulated and observed lengths of the cropping period. Agreement was especially high for wheat, with mean absolute errors of less than 3 weeks. In the main maize cropping regions, cropping periods were over- and underestimated by 0.5-1.5 months. We also found that interannual variability in simulated wheat harvest dates was more realistic when accounting for photoperiod effects. Main conclusions The methodology presented here provides a good basis for modelling the phenological characteristics of cultivars at the global scale. We show that current global patterns of growing season length as described in cropping calendars can be largely reproduced by phenology models if location-specific parameters are derived from temperature and day length indicators. Growing seasons can be modelled more accurately for wheat than for maize, especially in warm regions. Our method for computing parameters for phenology models from temperature and day length offers opportunities to improve the simulation of crop productivity by crop simulation models developed for large spatial areas and for long-term climate impact projections that account for adaptation in the selection of varieties

Abstract: Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (-2 to +9 degrees C) and precipitation (-50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses. The model ensemble was used to simulate yields of winter and spring wheat at four sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern. The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description. Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index. Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.