| Author |
Title |
Year |
Publication |
Volume  |
Pages |
| Tao, F.; Roetter, R.P.; Palosuo, T.; Diaz-Ambrona, C.G.H.; Ines Minguez, M.; Semenov, M.A.; Kersebaum, K.C.; Nendel, C.; Cammarano, D.; Hoffmann, H.; Ewert, F.; Dambreville, A.; Martre, P.; Rodriguez, L.; Ruiz-Ramos, M.; Gaiser, T.; Hohn, J.G.; Salo, T.; Ferrise, R.; Bindi, M.; Schulman, A.H. |
Designing future barley ideotypes using a crop model ensemble |
2017 |
European Journal of Agronomy |
82 |
144-162 |
| Calanca, P.; Semenov, M.A. |
Local-scale climate scenarios for impact studies and risk assessments: integration of early 21st century ENSEMBLES projections into the ELPIS database |
2013 |
Theoretical and Applied Climatology |
113 |
445-455 |
| Lake, I.R.; Jones, N.R.; Agnew, M.; Goodess, C.M.; Giorgi, F.; Hamaoui-Laguel, L.; Semenov, M.A.; Solomon, F.; Storkey, J.; Vautard, R.; Epstein, M.M. |
Climate change and future pollen allergy in Europe |
2017 |
Environ Health Perspect |
125 |
385-391 |
| Ruiz-Ramos, M.; Ferrise, R.; Rodriguez, A.; Lorite, I.J.; Bindi, M.; Carter, T.R.; Fronzek, S.; Palosuo, T.; Pirttioja, N.; Baranowski, P.; Buis, S.; Cammarano, D.; Chen, Y.; Dumont, B.; Ewert, F.; Gaiser, T.; Hlavinka, P.; Hoffmann, H.; Hoehn, J.G.; Jurecka, F.; Kersebaum, K.C.; Krzyszczak, J.; Lana, M.; Mechiche-Alami, A.; Minet, J.; Montesino, M.; Nendel, C.; Porter, J.R.; Ruget, F.; Semenov, M.A.; Steinmetz, Z.; Stratonovitch, P.; Supit, I.; Tao, F.; Trnka, M.; de Wit, A.; Roetter, R.P. |
Adaptation response surfaces for managing wheat under perturbed climate and CO2 in a Mediterranean environment |
2018 |
Agricultural Systems |
159 |
260-274 |
| Hoffmann, M.P.; Haakana, M.; Asseng, S.; Höhn, J.G.; Palosuo, T.; Ruiz-Ramos, M.; Fronzek, S.; Ewert, F.; Gaiser, T.; Kassie, B.T.; Paff, K.; Rezaei, E.E.; Rodríguez, A.; Semenov, M.; Srivastava, A.K.; Stratonovitch, P.; Tao, F.; Chen, Y.; Rötter, R.P. |
How does inter-annual variability of attainable yield affect the magnitude of yield gaps for wheat and maize? An analysis at ten sites |
2017 |
Agricultural Systems |
159 |
199-208 |
