Abstract: Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (−2 to +9°C) and precipitation (−50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses.   The model ensemble was used to simulate yields of winter and spring wheat at sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern.   The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes, Figure 1) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description.   Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index.   Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.   The full manuscript of this study is currently under revision (Fronzek et al. 2017).

Abstract: Ensembles of process-based crop models are increasingly used to simulate crop growth for scenarios of temperature and/or precipitation changes corresponding to different projections of atmospheric CO2 concentrations. This approach generates large datasets with thousands of simulated crop yield data. Such datasets potentially provide new information but it is difficult to summarize them in a useful way due to their structural complexities. An associated issue is that it is not straightforward to compare crops and to interpolate the results to alternative climate scenarios not initially included in the simulation protocols. Here we demonstrate that statistical models based on random-coefficient regressions are able to emulate ensembles of process-based crop models. An important advantage of the proposed statistical models is that they can interpolate between temperature levels and between CO2 concentration levels, and can thus be used to calculate temperature and [CO2] thresholds leading to yield loss or yield gain, without rerunning the original complex crop models. Our approach is illustrated with three yield datasets simulated by 19 maize models, 26 wheat models, and 13 rice models. Several statistical models are fitted to these datasets, and are then used to analyze the variability of the yield response to [CO2] and temperature. Based on our results, we show that, for wheat, a [CO2] increase is likely to outweigh the negative effect of a temperature increase of +2 degrees C in the considered sites. Compared to wheat, required levels of [CO2] increase are much higher for maize, and intermediate for rice. For all crops, uncertainties in simulating climate change impacts increase more with temperature than with elevated [CO2].