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Author (up) Eyshi Rezaei, E.; Siebert, S.; Ewert, F. url  doi
openurl 
  Title Impact of data resolution on heat and drought stress simulated for winter wheat in Germany Type Journal Article
  Year 2015 Publication European Journal of Agronomy Abbreviated Journal European Journal of Agronomy  
  Volume 65 Issue Pages 69-82  
  Keywords crop modeling; heat; drought; spatial resolution; wheat; high-temperature stress; climate-change; grain-yield; crop models; data aggregation; abiotic stress; short periods; variability; growth; duration  
  Abstract Heat and drought stress can reduce crop yields considerably which is increasingly assessed with crop models for larger areas. Applying these models originally developed for the field scale at large spatial extent typically implies the use of input data with coarse resolution. Little is known about the effect of data resolution on the simulated impact of extreme events like heat and drought on crops. Hence, in this study the effect of input and output data aggregation on simulated heat and drought stress and their impact on yield of winter wheat is systematically analyzed. The crop model SIMPLACE was applied for the period 1980-2011 across Germany at a resolution of 1 km x 1 km. Weather and soil input data and model output data were then aggregated to 10 km x 10 km, 25 km x 25 km, 50 km x 50 km and 100 km x 100 km resolution to analyze the aggregation effect on heat and drought stress and crop yield. We found that aggregation of model input and output data barely influenced the mean and median of heat and drought stress reduction factors and crop yields simulated across Germany. However, data aggregation resulted in less spatial variability of model results and a reduced severity of simulated stress events, particularly for regions with high heterogeneity in weather and soil conditions. Comparisons of simulations at coarse resolution with those at high resolution showed distinct patterns of positive and negative deviations which compensated each other so that aggregation effects for large regions were small for mean or median yields. Therefore, modelling at a resolution of 100 km x 100 km was sufficient to determine mean wheat yield as affected by heat and drought stress for Germany. Further research is required to clarify whether the results can be generalized across crop models differing in structure and detail. Attention should also be given to better understand the effect of data resolution on interactions between heat and drought impacts. (C) 2015 Elsevier B.V. All rights reserved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1161-0301 ISBN Medium Article  
  Area Expedition Conference  
  Notes CropM, ft_macsur Approved no  
  Call Number MA @ admin @ Serial 4751  
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Author (up) Semenov, M.A.; Stratonovitch, P.; Alghabari, F.; Gooding, M.J. doi  openurl
  Title Adapting wheat in Europe for climate change Type Journal Article
  Year 2014 Publication Journal of Cereal Science Abbreviated Journal J. Ceareal Sci.  
  Volume 59 Issue 3 Pages 245-256  
  Keywords A, maximum area of flag leaf area; ABA, abscisic acid; CV, coefficient of variation; Crop improvement; Crop modelling; FC, field capacity; GMT, Greenwich mean time; GS, growth stage; Gf, grain filling duration; HI, harvest index; HSP, heat shock protein; Heat and drought tolerance; Impact assessment; LAI, leaf area index; Ph, phylochron; Pp, photoperiod response; Ru, root water uptake; S, duration of leaf senescence; SF, drought stress factor; Sirius; Wheat ideotype  
  Abstract Increasing cereal yield is needed to meet the projected increased demand for world food supply of about 70% by 2050. Sirius, a process-based model for wheat, was used to estimate yield potential for wheat ideotypes optimized for future climatic projections for ten wheat growing areas of Europe. It was predicted that the detrimental effect of drought stress on yield would be decreased due to enhanced tailoring of phenology to future weather patterns, and due to genetic improvements in the response of photosynthesis and green leaf duration to water shortage. Yield advances could be made through extending maturation and thereby improve resource capture and partitioning. However the model predicted an increase in frequency of heat stress at meiosis and anthesis. Controlled environment experiments quantify the effects of heat and drought at booting and flowering on grain numbers and potential grain size. A current adaptation of wheat to areas of Europe with hotter and drier summers is a quicker maturation which helps to escape from excessive stress, but results in lower yields. To increase yield potential and to respond to climate change, increased tolerance to heat and drought stress should remain priorities for the genetic improvement of wheat.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0733-5210 ISBN Medium Review  
  Area Expedition Conference  
  Notes CropM, ft_macsur Approved no  
  Call Number MA @ admin @ Serial 4543  
Permanent link to this record
 

 
Author (up) Zhang, S.; Tao, F.; Zhang, Z. doi  openurl
  Title Uncertainty from model structure is larger than that from model parameters in simulating rice phenology in China Type Journal Article
  Year 2017 Publication European Journal of Agronomy Abbreviated Journal Europ. J. Agron.  
  Volume 87 Issue Pages 30-39  
  Keywords Crop model, Extreme weather, Impacts, Rice development rate, Uncertainty; Climate-Change; Growth Duration; Crop Model; Ceres-Rice; Wheat; Temperature; Impact; Yield; Optimization; Performance  
  Abstract Rice models have been widely used in simulating and predicting rice phenology in contrasting climate zones, however the uncertainties from model structure (different equations or models) and/or model parameters were rarely investigated. Here, five rice phenological models/modules (Le., CERES-Rice, ORYZA2000, RCM, Beta Model and SIMRIW) were applied to simulate rice phenology at 23 experimental stations from 1992 to 2009 in two major rice cultivation regions of China: the northeastern China and the southwestern China. To investigate the uncertainties from model biophysical parameters, each model was run with randomly perturbed 50 sets of parameters. The results showed that the median of ensemble simulations were better than the simulation by most models. Models couldn’t simulate well in some specific years despite of parameters optimization, suggesting model structure limit model performance in some cases. The models adopting accumulative thermal time function (e.g., CERES-Rice and ORYZA2000) had better performance in the southwestern China, in contrast, those adopting exponential function (e.g., Beta model and RCM model) had better performance in the northeastern China. In northeastern China, the contribution of model structure and model parameters to model total variance was, respectively, about 55.90% and 44.10% in simulating heading date, and about 75.43% and 24.57% in simulating maturity date. In the southwestern China, the contribution of model structure and model parameters to model total variance was, respectively, about 79.97% and 27.03% in simulating heading date, about 92.15% and 7.85% in simulating maturity date. Uncertainty from model structure was the most relevant source. The results highlight that the temperature response functions of rice development rate under extreme climate conditions should be improved based on environment-controlled experimental data.  
  Address 2017-08-07  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1161-0301 ISBN Medium Article  
  Area Expedition Conference  
  Notes CropM, ft_macsur Approved no  
  Call Number MA @ admin @ Serial 5170  
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