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Author Hoffmann, H.; Zhao, G.; Asseng, S.A.U.-,; Bindi, M.; Cammarano, D.; Constantin, J.; Coucheney, E.; Dechow, R.; Doro, L.; Eckersten, H.; Gaiser, T.; Grosz, B.; Haas, E.; Kassie, B.; Kersebaum, K.C.; Kiese, R.; Klatt, S.; Kuhnert, M.; Lewan, E.; Moriondo, M.; Nendel, C.; Raynal, H.; Roggero, P.P.; Rötter, R.; Siebert, S.; Sosa, C.; Specka, X.; Tao, F.; Teixeira, E.; Trombi, G.; Yeluripati, J.; Vanuytrecht, E.; Wallach, D.; Wang, E.; Weihermüller, L.; Zhao, Z.; Ewert, F.
Title (up) Analysing data aggregation effects on large-scale yield simulations Type Conference Article
Year 2016 Publication Abbreviated Journal
Volume Issue Pages
Keywords
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Berlin (Germany) Editor
Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Medium
Area Expedition Conference International Crop Modelling Symposium iCROPM 2016, 2016-05-15 to 2016-05-17, Berlin, Germany
Notes Approved no
Call Number MA @ admin @ Serial 4923
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Author Fronzek, S.; Pirttioja, N.; Carter, T.R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.-F.; Dumont, B.; Ewert, F.; Ferrise, R.; François, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.-C.; Kollas, C.; Krzyszczak, J.; Lorite, I.J.; Minet, J.; Minguez, M.I.; Montesino, M.; Moriondo, M.; Müller, C.; Nendel, C.; Öztürk, I.; Perego, A.; Rodríguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinsky, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rötter, R.P.
Title (up) Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change Type Report
Year 2017 Publication FACCE MACSUR Reports Abbreviated Journal
Volume 10 Issue Pages C4.3-D1
Keywords
Abstract Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (−2 to +9°C) and precipitation (−50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses.   The model ensemble was used to simulate yields of winter and spring wheat at sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern.   The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes, Figure 1) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description.   Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index.   Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.   The full manuscript of this study is currently under revision (Fronzek et al. 2017).
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Medium
Area Expedition Conference
Notes CropM Approved no
Call Number MA @ admin @ Serial 4956
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Author Fronzek, S.; Pirttioja, N.; Carter, T.R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.-F.; Dumont, B.; Ewert, F.; Ferrise, R.; Francois, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.C.; Kollas, C.; Krzyszczaki, J.; Lorite, I.J.; Minet, J.; Ines Minguez, M.; Montesino, M.; Moriondo, M.; Mueller, C.; Nendel, C.; Ozturk, I.; Perego, A.; Rodriguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinski, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rotter, R.P.
Title (up) Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change Type Journal Article
Year 2018 Publication Agricultural Systems Abbreviated Journal Agric. Syst.
Volume 159 Issue Pages 209-224
Keywords Classification; Climate change; Crop model; Ensemble; Sensitivity analysis; Wheat; Climate-Change; Crop Models; Probabilistic Assessment; Simulating; Impacts; British Catchments; Uncertainty; Europe; Productivity; Calibration; Adaptation
Abstract Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (-2 to +9 degrees C) and precipitation (-50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses. The model ensemble was used to simulate yields of winter and spring wheat at four sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern. The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description. Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index. Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.
Address 2018-01-25
Corporate Author Thesis
Publisher Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0308-521x ISBN Medium
Area Expedition Conference
Notes CropM, ft_macsur Approved no
Call Number MA @ admin @ Serial 5186
Permanent link to this record
 

 
Author Fronzek, S.; Pirttioja, N.; Carter, T.R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.-F.; Dumont, B.; Ewert, F.; Ferrise, R.; François, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.C.; Kollas, C.; Krzyszczak, J.; Lorite, I.J.; Minet, J.; Minguez, M.I.; Montesino, M.; Moriondo, M.; Müller, C.; Nendel, C.; Öztürk, I.; Perego, A.; Rodríguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinski, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rötter, R.P.
Title (up) Classifying simulated wheat yield responses to changes in temperature and precipitation across a European transect Type Conference Article
Year 2016 Publication Abbreviated Journal
Volume Issue Pages
Keywords
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Berlin (Germany) Editor
Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Medium
Area Expedition Conference International Crop Modelling Symposium iCROPM 2016, 2016-05-15 to 2016-05-17, Berlin, Germany
Notes Approved no
Call Number MA @ admin @ Serial 4921
Permanent link to this record
 

 
Author Maiorano, A.; Martre, P.; Asseng, S.; Ewert, F.; Müller, C.; Rötter, R.P.; Ruane, A.C.; Semenov, M.A.; Wallach, D.; Wang, E.; Alderman, P.D.; Kassie, B.T.; Biernath, C.; Basso, B.; Cammarano, D.; Challinor, A.J.; Doltra, J.; Dumont, B.; Rezaei, E.E.; Gayler, S.; Kersebaum, K.C.; Kimball, B.A.; Koehler, A.-K.; Liu, B.; O’Leary, G.J.; Olesen, J.E.; Ottman, M.J.; Priesack, E.; Reynolds, M.; Stratonovitch, P.; Streck, T.; Thorburn, P.J.; Waha, K.; Wall, G.W.; White, J.W.; Zhao, Z.; Zhu, Y.
Title (up) Crop model improvement reduces the uncertainty of the response to temperature of multi-model ensembles Type Journal Article
Year 2016 Publication Field Crops Research Abbreviated Journal Field Crops Research
Volume 202 Issue Pages 5-20
Keywords Impact uncertainty; High temperature; Model improvement; Multi-model ensemble; Wheat crop model
Abstract To improve climate change impact estimates and to quantify their uncertainty, multi-model ensembles (MMEs) have been suggested. Model improvements can improve the accuracy of simulations and reduce the uncertainty of climate change impact assessments. Furthermore, they can reduce the number of models needed in a MME. Herein, 15 wheat growth models of a larger MME were improved through re-parameterization and/or incorporating or modifying heat stress effects on phenology, leaf growth and senescence, biomass growth, and grain number and size using detailed field experimental data from the USDA Hot Serial Cereal experiment (calibration data set). Simulation results from before and after model improvement were then evaluated with independent field experiments from a CIMMYT world-wide field trial network (evaluation data set). Model improvements decreased the variation (10th to 90th model ensemble percentile range) of grain yields simulated by the MME on average by 39% in the calibration data set and by 26% in the independent evaluation data set for crops grown in mean seasonal temperatures >24 °C. MME mean squared error in simulating grain yield decreased by 37%. A reduction in MME uncertainty range by 27% increased MME prediction skills by 47%. Results suggest that the mean level of variation observed in field experiments and used as a benchmark can be reached with half the number of models in the MME. Improving crop models is therefore important to increase the certainty of model-based impact assessments and allow more practical, i.e. smaller MMEs to be used effectively.
Address 2016-09-13
Corporate Author Thesis
Publisher Place of Publication Editor
Language Language Summary Language Newsletter July 2016 Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0378-4290 ISBN Medium Article
Area CropM Expedition Conference
Notes CropMwp;wos; ft=macsur; wsnot_yet; Approved no
Call Number MA @ admin @ Serial 4776
Permanent link to this record