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Author Makowski, D.; Asseng, S.; Ewert, F.; Bassu, S.; Durand, J.L.; Li, T.; Martre, P.; Adam, M.; Aggarwal, P.K.; Angulo, C.; Baron, C.; Basso, B.; Bertuzzi, P.; Biernath, C.; Boogaard, H.; Boote, K.J.; Bouman, B.; Bregaglio, S.; Brisson, N.; Buis, S.; Cammarano, D.; Challinor, A.J.; Confalonieri, R.; Conijn, J.G.; Corbeels, M.; Deryng, D.; De Sanctis, G.; Doltra, J.; Fumoto, T.; Gaydon, D.; Gayler, S.; Goldberg, R.; Grant, R.F.; Grassini, P.; Hatfield, J.L.; Hasegawa, T.; Heng, L.; Hoek, S.; Hooker, J.; Hunt, L.A.; Ingwersen, J.; Izaurralde, R.C.; Jongschaap, R.E.E.; Jones, J.W.; Kemanian, R.A.; Kersebaum, K.C.; Kim, S.-H.; Lizaso, J.; Marcaida, M.; Müller, C.; Nakagawa, H.; Naresh Kumar, S.; Nendel, C.; O’Leary, G.J.; Olesen, J.E.; Oriol, P.; Osborne, T.M.; Palosuo, T.; Pravia, M.V.; Priesack, E.; Ripoche, D.; Rosenzweig, C.; Ruane, A.C.; Ruget, F.; Sau, F.; Semenov, M.A.; Shcherbak, I.; Singh, B.; Singh, U.; Soo, H.K.; Steduto, P.; Stöckle, C.; Stratonovitch, P.; Streck, T.; Supit, I.; Tang, L.; Tao, F.; Teixeira, E.I.; Thorburn, P.; Timlin, D.; Travasso, M.; Rötter, R.P.; Waha, K.; Wallach, D.; White, J.W.; Wilkens, P.; Williams, J.R.; Wolf, J.; Yin, X.; Yoshida, H.; Zhang, Z.; Zhu, Y.
Title (up) A statistical analysis of three ensembles of crop model responses to temperature and CO2 concentration Type Journal Article
Year 2015 Publication Agricultural and Forest Meteorology Abbreviated Journal Agricultural and Forest Meteorology
Volume 214-215 Issue Pages 483-493
Keywords climate change; crop model; emulator; meta-model; statistical model; yield; climate-change; wheat yields; metaanalysis; uncertainty; simulation; impacts
Abstract Ensembles of process-based crop models are increasingly used to simulate crop growth for scenarios of temperature and/or precipitation changes corresponding to different projections of atmospheric CO2 concentrations. This approach generates large datasets with thousands of simulated crop yield data. Such datasets potentially provide new information but it is difficult to summarize them in a useful way due to their structural complexities. An associated issue is that it is not straightforward to compare crops and to interpolate the results to alternative climate scenarios not initially included in the simulation protocols. Here we demonstrate that statistical models based on random-coefficient regressions are able to emulate ensembles of process-based crop models. An important advantage of the proposed statistical models is that they can interpolate between temperature levels and between CO2 concentration levels, and can thus be used to calculate temperature and [CO2] thresholds leading to yield loss or yield gain, without rerunning the original complex crop models. Our approach is illustrated with three yield datasets simulated by 19 maize models, 26 wheat models, and 13 rice models. Several statistical models are fitted to these datasets, and are then used to analyze the variability of the yield response to [CO2] and temperature. Based on our results, we show that, for wheat, a [CO2] increase is likely to outweigh the negative effect of a temperature increase of +2 degrees C in the considered sites. Compared to wheat, required levels of [CO2] increase are much higher for maize, and intermediate for rice. For all crops, uncertainties in simulating climate change impacts increase more with temperature than with elevated [CO2].
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-1923 ISBN Medium Article
Area Expedition Conference
Notes CropM, ft_macsur Approved no
Call Number MA @ admin @ Serial 4714
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Author Waha, K.; Müller, C.; Bondeau, A.; Dietrich, J.P.; Kurukulasuriya, P.; Heinke, J.; Lotze-Campen, H.
Title (up) Adaptation to climate change through the choice of cropping system and sowing date in sub-Saharan Africa Type Journal Article
Year 2013 Publication Global Environmental Change Abbreviated Journal Glob. Environ. Change
Volume 23 Issue 1 Pages 130-143
Keywords multiple cropping; sequential cropping systems; crop modelling; agricultural management; adaptation options; global vegetation model; future food-production; rainy-season; west-africa; agriculture; yield; maize; soil; variability; heat
Abstract Multiple cropping systems provide more harvest security for farmers, allow for crop intensification and furthermore influence ground cover, soil erosion, albedo, soil chemical properties, pest infestation and the carbon sequestration potential. We identify the traditional sequential cropping systems in ten sub-Saharan African countries from a survey dataset of more than 8600 households. We find that at least one sequential cropping system is traditionally used in 35% of all administrative units in the dataset, mainly including maize or groundnuts. We compare six different management scenarios and test their susceptibility as adaptation measure to climate change using the dynamic global vegetation model for managed land LPJmL. Aggregated mean crop yields in sub-Saharan Africa decrease by 6-24% due to climate change depending on the climate scenario and the management strategy. As an exception, some traditional sequential cropping systems in Kenya and South Africa gain by at least 25%. The crop yield decrease is typically weakest in sequential cropping systems and if farmers adapt the sowing date to changing climatic conditions. Crop calorific yields in single cropping systems only reach 40-55% of crop calorific yields obtained in sequential cropping systems at the end of the 21st century. The farmers’ choice of adequate crops, cropping systems and sowing dates can be an important adaptation strategy to climate change and these management options should be considered in climate change impact studies on agriculture. (C) 2012 Elsevier Ltd. All rights reserved.
Address 2016-10-31
Corporate Author Thesis
Publisher Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0959-3780 ISBN Medium Article
Area Expedition Conference
Notes CropM Approved no
Call Number MA @ admin @ Serial 4823
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Author Fronzek, S.; Pirttioja, N.; Carter, T.R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.-F.; Dumont, B.; Ewert, F.; Ferrise, R.; François, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.-C.; Kollas, C.; Krzyszczak, J.; Lorite, I.J.; Minet, J.; Minguez, M.I.; Montesino, M.; Moriondo, M.; Müller, C.; Nendel, C.; Öztürk, I.; Perego, A.; Rodríguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinsky, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rötter, R.P.
Title (up) Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change Type Report
Year 2017 Publication FACCE MACSUR Reports Abbreviated Journal
Volume 10 Issue Pages C4.3-D1
Keywords
Abstract Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (−2 to +9°C) and precipitation (−50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses.   The model ensemble was used to simulate yields of winter and spring wheat at sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern.   The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes, Figure 1) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description.   Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index.   Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.   The full manuscript of this study is currently under revision (Fronzek et al. 2017).
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Medium
Area Expedition Conference
Notes CropM Approved no
Call Number MA @ admin @ Serial 4956
Permanent link to this record
 

 
Author Fronzek, S.; Pirttioja, N.; Carter, T.R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.-F.; Dumont, B.; Ewert, F.; Ferrise, R.; Francois, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.C.; Kollas, C.; Krzyszczaki, J.; Lorite, I.J.; Minet, J.; Ines Minguez, M.; Montesino, M.; Moriondo, M.; Mueller, C.; Nendel, C.; Ozturk, I.; Perego, A.; Rodriguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinski, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rotter, R.P.
Title (up) Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change Type Journal Article
Year 2018 Publication Agricultural Systems Abbreviated Journal Agric. Syst.
Volume 159 Issue Pages 209-224
Keywords Classification; Climate change; Crop model; Ensemble; Sensitivity analysis; Wheat; Climate-Change; Crop Models; Probabilistic Assessment; Simulating; Impacts; British Catchments; Uncertainty; Europe; Productivity; Calibration; Adaptation
Abstract Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (-2 to +9 degrees C) and precipitation (-50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses. The model ensemble was used to simulate yields of winter and spring wheat at four sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern. The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description. Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index. Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.
Address 2018-01-25
Corporate Author Thesis
Publisher Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0308-521x ISBN Medium
Area Expedition Conference
Notes CropM, ft_macsur Approved no
Call Number MA @ admin @ Serial 5186
Permanent link to this record
 

 
Author Fronzek, S.; Pirttioja, N.; Carter, T.R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.-F.; Dumont, B.; Ewert, F.; Ferrise, R.; François, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.C.; Kollas, C.; Krzyszczak, J.; Lorite, I.J.; Minet, J.; Minguez, M.I.; Montesino, M.; Moriondo, M.; Müller, C.; Nendel, C.; Öztürk, I.; Perego, A.; Rodríguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinski, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rötter, R.P.
Title (up) Classifying simulated wheat yield responses to changes in temperature and precipitation across a European transect Type Conference Article
Year 2016 Publication Abbreviated Journal
Volume Issue Pages
Keywords
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Berlin (Germany) Editor
Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Medium
Area Expedition Conference International Crop Modelling Symposium iCROPM 2016, 2016-05-15 to 2016-05-17, Berlin, Germany
Notes Approved no
Call Number MA @ admin @ Serial 4921
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