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Author Liu, B.; Asseng, S.; Müller, C.; Ewert, F.; Elliott, J.; Lobell, D. B.; Martre, P.; Ruane, A. C.; Wallach, D.; Jones, J. W.; Rosenzweig, C.; Aggarwal, P. K.; Alderman, P. D.; Anothai, J.; Basso, B.; Biernath, C.; Cammarano, D.; Challinor, A.; Deryng, D.; Sanctis, G. D.; Doltra, J.; Fereres, E.; Folberth, C.; Garcia-Vila, M.; Gayler, S.; Hoogenboom, G.; Hunt, L. A.; Izaurralde, R. C.; Jabloun, M.; Jones, C. D.; Kersebaum, K. C.; Kimball, B. A.; Koehler, A.-K.; Kumar, S. N.; Nendel, C.; O’Leary, G. J.; Olesen, J. E.; Ottman, M. J.; Palosuo, T.; Prasad, P. V. V.; Priesack, E.; Pugh, T. A. M.; Reynolds, M.; Rezaei, E. E.; Rötter, R. P.; Schmid, E.; Semenov, M. A.; Shcherbak, I.; Stehfest, E.; Stöckle, C. O.; Stratonovitch, P.; Streck, T.; Supit, I.; Tao, F.; Thorburn, P.; Waha, K.; Wall, G. W.; Wang, E.; White, J. W.; Wolf, J.; Zhao, Z.; Zhu, Y. url  doi
openurl 
  Title Similar estimates of temperature impacts on global wheat yield by three independent methods Type Journal Article
  Year 2016 Publication Nature Climate Change Abbreviated Journal Nat. Clim. Change  
  Volume 6 Issue 12 Pages 1130-1136  
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  ISSN 1758-678x ISBN Medium article  
  Area Expedition Conference  
  Notes CropM Approved no  
  Call Number MA @ admin @ Serial 4965  
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Author Asseng, S.; Ewert, F.; Martre, P.; Rötter, R.P.; Lobell, D.B.; Cammarano, D.; Kimball, B.A.; Ottman, M.J.; Wall, G.W.; White, J.W.; Reynolds, M.P.; Alderman, P.D.; Prasad, P.V.V.; Aggarwal, P.K.; Anothai, J.; Basso, B.; Biernath, C.; Challinor, A.J.; De Sanctis, G.; Doltra, J.; Fereres, E.; Garcia-Vila, M.; Gayler, S.; Hoogenboom, G.; Hunt, L.A.; Izaurralde, R.C.; Jabloun, M.; Jones, C.D.; Kersebaum, K.C.; Koehler, A.-K.; Müller, C.; Naresh Kumar, S.; Nendel, C.; O’Leary, G.; Olesen, J.E.; Palosuo, T.; Priesack, E.; Eyshi Rezaei, E.; Ruane, A.C.; Semenov, M.A.; Shcherbak, I.; Stöckle, C.; Stratonovitch, P.; Streck, T.; Supit, I.; Tao, F.; Thorburn, P.J.; Waha, K.; Wang, E.; Wallach, D.; Wolf, J.; Zhao, Z.; Zhu, Y. url  doi
openurl 
  Title Rising temperatures reduce global wheat production Type Journal Article
  Year 2014 Publication Nature Climate Change Abbreviated Journal Nat. Clim. Change  
  Volume 5 Issue 2 Pages 143-147  
  Keywords climate-change; spring wheat; dryland wheat; yield; growth; drought; heat; CO2; agriculture; adaptation  
  Abstract Crop models are essential tools for assessing the threat of climate change to local and global food production1. Present models used to predict wheat grain yield are highly uncertain when simulating how crops respond to temperature2. Here we systematically tested 30 different wheat crop models of the Agricultural Model Intercomparison and Improvement Project against field experiments in which growing season mean temperatures ranged from 15 °C to 32 °C, including experiments with artificial heating. Many models simulated yields well, but were less accurate at higher temperatures. The model ensemble median was consistently more accurate in simulating the crop temperature response than any single model, regardless of the input information used. Extrapolating the model ensemble temperature response indicates that warming is already slowing yield gains at a majority of wheat-growing locations. Global wheat production is estimated to fall by 6% for each °C of further temperature increase and become more variable over space and time.  
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  ISSN 1758-678x ISBN Medium Article  
  Area Expedition Conference  
  Notes CropM, ft_macsur Approved no  
  Call Number MA @ admin @ Serial 4550  
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Author Asseng, S.; Ewert, F.; Rosenzweig, C.; Jones, J.W.; Hatfield, J.L.; Ruane, A.C.; Boote, K.J.; Thorburn, P.J.; Rötter, R.P.; Cammarano, D.; Brisson, N.; Basso, B.; Martre, P.; Aggarwal, P.K.; Angulo, C.; Bertuzzi, P.; Biernath, C.; Challinor, A.J.; Doltra, J.; Gayler, S.; Goldberg, R.; Grant, R.; Heng, L.; Hooker, J.; Hunt, L.A.; Ingwersen, J.; Izaurralde, R.C.; Kersebaum, K.C.; Müller, C.; Naresh Kumar, S.; Nendel, C.; O’Leary, G.; Olesen, J.E.; Osborne, T.M.; Palosuo, T.; Priesack, E.; Ripoche, D.; Semenov, M.A.; Shcherbak, I.; Steduto, P.; Stöckle, C.; Stratonovitch, P.; Streck, T.; Supit, I.; Tao, F.; Travasso, M.; Waha, K.; Wallach, D.; White, J.W.; Williams, J.R.; Wolf, J. url  doi
openurl 
  Title Uncertainty in simulating wheat yields under climate change Type Journal Article
  Year 2013 Publication Nature Climate Change Abbreviated Journal Nat. Clim. Change  
  Volume 3 Issue 9 Pages 827-832  
  Keywords crop production; models; food; co2; temperature; projections; adaptation; scenarios; ensemble; impacts  
  Abstract Projections of climate change impacts on crop yields are inherently uncertain(1). Uncertainty is often quantified when projecting future greenhouse gas emissions and their influence on climate(2). However, multi-model uncertainty analysis of crop responses to climate change is rare because systematic and objective comparisons among process-based crop simulation models(1,3) are difficult(4). Here we present the largest standardized model intercomparison for climate change impacts so far. We found that individual crop models are able to simulate measured wheat grain yields accurately under a range of environments, particularly if the input information is sufficient. However, simulated climate change impacts vary across models owing to differences in model structures and parameter values. A greater proportion of the uncertainty in climate change impact projections was due to variations among crop models than to variations among downscaled general circulation models. Uncertainties in simulated impacts increased with CO2 concentrations and associated warming. These impact uncertainties can be reduced by improving temperature and CO2 relationships in models and better quantified through use of multi-model ensembles. Less uncertainty in describing how climate change may affect agricultural productivity will aid adaptation strategy development and policymaking.  
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  ISSN 1758-678x ISBN Medium Article  
  Area Expedition Conference  
  Notes CropM, ftnotmacsur, IPCC-AR5 Approved no  
  Call Number MA @ admin @ Serial 4599  
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Author Pirttioja, N.; Carter, T.R.; Fronzek, S.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.F.; Dumont, B.; Ewert, F.; Ferrise, R.; François, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.C.; Kollas, C.; Krzyszczak, J.; Lorite, I.J.; Minet, J.; Minguez, M.I.; Montesino-San Martin, M.; Moriondo, M.; Müller, C.; Nendel, C.; Öztürk, I.; Perego, A.; Rodríguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinski, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rötter, R.P. url  doi
openurl 
  Title Temperature and precipitation effects on wheat yield across a European transect: a crop model ensemble analysis using impact response surfaces Type Journal Article
  Year 2015 Publication Climate Research Abbreviated Journal Clim. Res.  
  Volume 65 Issue Pages 87-105  
  Keywords climate; crop model; impact response surface; IRS; sensitivity analysis; wheat; yield; climate-change impacts; uncertainty; 21st-century; projections; simulation; growth; region  
  Abstract This study explored the utility of the impact response surface (IRS) approach for investigating model ensemble crop yield responses under a large range of changes in climate. IRSs of spring and winter wheat Triticum aestivum yields were constructed from a 26-member ensemble of process-based crop simulation models for sites in Finland, Germany and Spain across a latitudinal transect. The sensitivity of modelled yield to systematic increments of changes in temperature (-2 to +9°C) and precipitation (-50 to +50%) was tested by modifying values of baseline (1981 to 2010) daily weather, with CO2 concentration fixed at 360 ppm. The IRS approach offers an effective method of portraying model behaviour under changing climate as well as advantages for analysing, comparing and presenting results from multi-model ensemble simulations. Though individual model behaviour occasionally departed markedly from the average, ensemble median responses across sites and crop varieties indicated that yields decline with higher temperatures and decreased precipitation and increase with higher precipitation. Across the uncertainty ranges defined for the IRSs, yields were more sensitive to temperature than precipitation changes at the Finnish site while sensitivities were mixed at the German and Spanish sites. Precipitation effects diminished under higher temperature changes. While the bivariate and multi-model characteristics of the analysis impose some limits to interpretation, the IRS approach nonetheless provides additional insights into sensitivities to inter-model and inter-annual variability. Taken together, these sensitivities may help to pinpoint processes such as heat stress, vernalisation or drought effects requiring refinement in future model development.  
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  ISSN 0936-577x 1616-1572 ISBN Medium Article  
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  Notes CropM, ft_macsur Approved no  
  Call Number MA @ admin @ Serial 4662  
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Author Rötter, R.P.; Asseng, S.; Ewert, F.; Rosenzweig, C.; Jones, J.W.; Hatfield, J.L.; Basso, B.; Ruane, A.; Boote, K.J.; Thorburn, P.; Brisson, N.; Martre, P.; Aggarwal, P.K.; Angulo, C.; Pertuzzi; Biernath, C.; Challinor, A.J.; Doltra, J.; Gayler, S.; Goldberg, R.; Heng, L.; Hooker, J.; Hunt, L.A.; Ingwersen, J.; Izaurralde, R.C.; Kersebaum, K.-C.; Müller, C.; Kumar, S.N.; Nendel, C.; O’Leary, G.; Olesen, J.E.; Osborne, T.M.; Palosuo, T.; Priesack, E.; Ripoche, D.; Semenov, M.A.; Shcherbak, I.; Steduto, P.; Stöckle, C.; Stratonovitch, P.; Streck, T.; Supit, I.; Tao, F.; Travasso, M.; Waha, K.; Wallach, D.; White, J.W.; Williams, J.R.; Wolf, J. url  openurl
  Title Quantifying Uncertainties in Modeling Crop Water Use under Climate Change Type Conference Article
  Year 2013 Publication Abbreviated Journal  
  Volume Issue Pages  
  Keywords CropM  
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  Area Expedition Conference Impacts World 2013, International Conference on Climate Change Effects, Potsdam, Germany, 2013-05-27 to 2013-05-30  
  Notes Approved no  
  Call Number MA @ admin @ Serial 2767  
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