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Author (up) Coucheney, E.; Buis, S.; Launay, M.; Constantin, J.; Mary, B.; García de Cortázar-Atauri, I.; Ripoche, D.; Beaudoin, N.; Ruget, F.; &rianarisoa, K.S.; Le Bas, C.; Justes, E.; Léonard, J. url  doi
openurl 
  Title Accuracy, robustness and behavior of the STICS soil–crop model for plant, water and nitrogen outputs: Evaluation over a wide range of agro-environmental conditions in France Type Journal Article
  Year 2015 Publication Environmental Modelling & Software Abbreviated Journal Env. Model. Softw.  
  Volume 64 Issue Pages 177-190  
  Keywords soil-crop model; stics; model performances; plant biomass; soil nitrogen; soil water; remote-sensing data; goodness-of-fit; hydrological model; simulation-models; solar-radiation; regional-scale; climate-change; generic model; data set; validation  
  Abstract Soil-crop models are increasingly used as predictive tools to assess yield and environmental impacts of agriculture in a growing diversity of contexts. They are however seldom evaluated at a given time over a wide domain of use. We tested here the performances of the STICS model (v8.2.2) with its standard set of parameters over a dataset covering 15 crops and a wide range of agropedoclimatic conditions in France. Model results showed a good overall accuracy, with little bias. Relative RMSE was larger for soil nitrate (49%) than for plant biomass (35%) and nitrogen (33%) and smallest for soil water (10%). Trends induced by contrasted environmental conditions and management practices were well reproduced. Finally, limited dependency of model errors on crops or environments indicated a satisfactory robustness. Such performances make STICS a valuable tool for studying the effects of changes in agro-ecosystems over the domain explored. (C) 2014 Elsevier Ltd. All rights reserved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1364-8152 ISBN Medium Article  
  Area Expedition Conference  
  Notes CropM Approved no  
  Call Number MA @ admin @ Serial 4554  
Permanent link to this record
 

 
Author (up) Fronzek, S.; Pirttioja, N.; Carter, T.R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.-F.; Dumont, B.; Ewert, F.; Ferrise, R.; François, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.-C.; Kollas, C.; Krzyszczak, J.; Lorite, I.J.; Minet, J.; Minguez, M.I.; Montesino, M.; Moriondo, M.; Müller, C.; Nendel, C.; Öztürk, I.; Perego, A.; Rodríguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinsky, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rötter, R.P. url  openurl
  Title Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change Type Report
  Year 2017 Publication FACCE MACSUR Reports Abbreviated Journal  
  Volume 10 Issue Pages C4.3-D1  
  Keywords  
  Abstract Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (−2 to +9°C) and precipitation (−50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses.   The model ensemble was used to simulate yields of winter and spring wheat at sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern.   The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes, Figure 1) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description.   Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index.   Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.   The full manuscript of this study is currently under revision (Fronzek et al. 2017).  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference  
  Notes CropM Approved no  
  Call Number MA @ admin @ Serial 4956  
Permanent link to this record
 

 
Author (up) Fronzek, S.; Pirttioja, N.; Carter, T.R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.-F.; Dumont, B.; Ewert, F.; Ferrise, R.; Francois, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.C.; Kollas, C.; Krzyszczaki, J.; Lorite, I.J.; Minet, J.; Ines Minguez, M.; Montesino, M.; Moriondo, M.; Mueller, C.; Nendel, C.; Ozturk, I.; Perego, A.; Rodriguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinski, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rotter, R.P. doi  openurl
  Title Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change Type Journal Article
  Year 2018 Publication Agricultural Systems Abbreviated Journal Agric. Syst.  
  Volume 159 Issue Pages 209-224  
  Keywords Classification; Climate change; Crop model; Ensemble; Sensitivity analysis; Wheat; Climate-Change; Crop Models; Probabilistic Assessment; Simulating; Impacts; British Catchments; Uncertainty; Europe; Productivity; Calibration; Adaptation  
  Abstract Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (-2 to +9 degrees C) and precipitation (-50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses. The model ensemble was used to simulate yields of winter and spring wheat at four sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern. The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description. Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index. Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.  
  Address 2018-01-25  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0308-521x ISBN Medium  
  Area Expedition Conference  
  Notes CropM, ft_macsur Approved no  
  Call Number MA @ admin @ Serial 5186  
Permanent link to this record
 

 
Author (up) Fronzek, S.; Pirttioja, N.; Carter, T.R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.-F.; Dumont, B.; Ewert, F.; Ferrise, R.; François, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.C.; Kollas, C.; Krzyszczak, J.; Lorite, I.J.; Minet, J.; Minguez, M.I.; Montesino, M.; Moriondo, M.; Müller, C.; Nendel, C.; Öztürk, I.; Perego, A.; Rodríguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinski, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rötter, R.P. url  openurl
  Title Classifying simulated wheat yield responses to changes in temperature and precipitation across a European transect Type Conference Article
  Year 2016 Publication Abbreviated Journal  
  Volume Issue Pages  
  Keywords  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Berlin (Germany) Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference International Crop Modelling Symposium iCROPM 2016, 2016-05-15 to 2016-05-17, Berlin, Germany  
  Notes Approved no  
  Call Number MA @ admin @ Serial 4921  
Permanent link to this record
 

 
Author (up) Makowski, D.; Asseng, S.; Ewert, F.; Bassu, S.; Durand, J.L.; Li, T.; Martre, P.; Adam, M.; Aggarwal, P.K.; Angulo, C.; Baron, C.; Basso, B.; Bertuzzi, P.; Biernath, C.; Boogaard, H.; Boote, K.J.; Bouman, B.; Bregaglio, S.; Brisson, N.; Buis, S.; Cammarano, D.; Challinor, A.J.; Confalonieri, R.; Conijn, J.G.; Corbeels, M.; Deryng, D.; De Sanctis, G.; Doltra, J.; Fumoto, T.; Gaydon, D.; Gayler, S.; Goldberg, R.; Grant, R.F.; Grassini, P.; Hatfield, J.L.; Hasegawa, T.; Heng, L.; Hoek, S.; Hooker, J.; Hunt, L.A.; Ingwersen, J.; Izaurralde, R.C.; Jongschaap, R.E.E.; Jones, J.W.; Kemanian, R.A.; Kersebaum, K.C.; Kim, S.-H.; Lizaso, J.; Marcaida, M.; Müller, C.; Nakagawa, H.; Naresh Kumar, S.; Nendel, C.; O’Leary, G.J.; Olesen, J.E.; Oriol, P.; Osborne, T.M.; Palosuo, T.; Pravia, M.V.; Priesack, E.; Ripoche, D.; Rosenzweig, C.; Ruane, A.C.; Ruget, F.; Sau, F.; Semenov, M.A.; Shcherbak, I.; Singh, B.; Singh, U.; Soo, H.K.; Steduto, P.; Stöckle, C.; Stratonovitch, P.; Streck, T.; Supit, I.; Tang, L.; Tao, F.; Teixeira, E.I.; Thorburn, P.; Timlin, D.; Travasso, M.; Rötter, R.P.; Waha, K.; Wallach, D.; White, J.W.; Wilkens, P.; Williams, J.R.; Wolf, J.; Yin, X.; Yoshida, H.; Zhang, Z.; Zhu, Y. url  doi
openurl 
  Title A statistical analysis of three ensembles of crop model responses to temperature and CO2 concentration Type Journal Article
  Year 2015 Publication Agricultural and Forest Meteorology Abbreviated Journal Agricultural and Forest Meteorology  
  Volume 214-215 Issue Pages 483-493  
  Keywords climate change; crop model; emulator; meta-model; statistical model; yield; climate-change; wheat yields; metaanalysis; uncertainty; simulation; impacts  
  Abstract Ensembles of process-based crop models are increasingly used to simulate crop growth for scenarios of temperature and/or precipitation changes corresponding to different projections of atmospheric CO2 concentrations. This approach generates large datasets with thousands of simulated crop yield data. Such datasets potentially provide new information but it is difficult to summarize them in a useful way due to their structural complexities. An associated issue is that it is not straightforward to compare crops and to interpolate the results to alternative climate scenarios not initially included in the simulation protocols. Here we demonstrate that statistical models based on random-coefficient regressions are able to emulate ensembles of process-based crop models. An important advantage of the proposed statistical models is that they can interpolate between temperature levels and between CO2 concentration levels, and can thus be used to calculate temperature and [CO2] thresholds leading to yield loss or yield gain, without rerunning the original complex crop models. Our approach is illustrated with three yield datasets simulated by 19 maize models, 26 wheat models, and 13 rice models. Several statistical models are fitted to these datasets, and are then used to analyze the variability of the yield response to [CO2] and temperature. Based on our results, we show that, for wheat, a [CO2] increase is likely to outweigh the negative effect of a temperature increase of +2 degrees C in the considered sites. Compared to wheat, required levels of [CO2] increase are much higher for maize, and intermediate for rice. For all crops, uncertainties in simulating climate change impacts increase more with temperature than with elevated [CO2].  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-1923 ISBN Medium Article  
  Area Expedition Conference  
  Notes CropM, ft_macsur Approved no  
  Call Number MA @ admin @ Serial 4714  
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