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Author Wallach, D.; Thorburn, P.; Asseng, S.; Challinor, A.J.; Ewert, F.; Jones, J.W.; Rötter, R.; Ruane, A. url  openurl
  Title Overview paper on comprehensive framework for assessment of error and uncertainty in crop model predictions Type Report
  Year 2016 Publication FACCE MACSUR Reports Abbreviated Journal  
  Volume 8 Issue Pages (down) C4.1-D  
  Keywords MACSUR_ACK; CropM  
  Abstract Crop models are important tools for impact assessment of climate change, as well as for  exploring management options under current climate. It is essential to evaluate the  uncertainty associated with predictions of these models. Several ways of quantifying  prediction uncertainty have been explored in the literature, but there have been no  studies of how the different approaches are related to one another, and how they are  related to some overall measure of prediction uncertainty. Here we show that all the  different approaches can be related to two different viewpoints about the model; either  the model is treated as a fixed predictor with some average error, or the model can be  treated as a random variable with uncertainty in one or more of model structure, model  inputs and model parameters. We discuss the differences, and show how mean squared  error of prediction can be estimated in both cases. The results can be used to put  uncertainty estimates into a more general framework and to relate different uncertainty  estimates to one another and to overall prediction uncertainty. This should lead to a  better understanding of crop model prediction uncertainty and the underlying causes of  that uncertainty. This study was published as (Wallach et al. 2016)  
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  Call Number MA @ office @ Serial 2954  
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Author Fronzek, S.; Pirttioja, N.; Carter, T.R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M.-F.; Dumont, B.; Ewert, F.; Ferrise, R.; François, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K.-C.; Kollas, C.; Krzyszczak, J.; Lorite, I.J.; Minet, J.; Minguez, M.I.; Montesino, M.; Moriondo, M.; Müller, C.; Nendel, C.; Öztürk, I.; Perego, A.; Rodríguez, A.; Ruane, A.C.; Ruget, F.; Sanna, M.; Semenov, M.A.; Slawinsky, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rötter, R.P. url  openurl
  Title Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change Type Report
  Year 2017 Publication FACCE MACSUR Reports Abbreviated Journal  
  Volume 10 Issue Pages (down) C4.3-D1  
  Keywords  
  Abstract Crop growth simulation models can differ greatly in their treatment of key processes and hence in their response to environmental conditions. Here, we used an ensemble of 26 process-based wheat models applied at sites across a European transect to compare their sensitivity to changes in temperature (−2 to +9°C) and precipitation (−50 to +50%). Model results were analysed by plotting them as impact response surfaces (IRSs), classifying the IRS patterns of individual model simulations, describing these classes and analysing factors that may explain the major differences in model responses.   The model ensemble was used to simulate yields of winter and spring wheat at sites in Finland, Germany and Spain. Results were plotted as IRSs that show changes in yields relative to the baseline with respect to temperature and precipitation. IRSs of 30-year means and selected extreme years were classified using two approaches describing their pattern.   The expert diagnostic approach (EDA) combines two aspects of IRS patterns: location of the maximum yield (nine classes, Figure 1) and strength of the yield response with respect to climate (four classes), resulting in a total of 36 combined classes defined using criteria pre-specified by experts. The statistical diagnostic approach (SDA) groups IRSs by comparing their pattern and magnitude, without attempting to interpret these features. It applies a hierarchical clustering method, grouping response patterns using a distance metric that combines the spatial correlation and Euclidian distance between IRS pairs. The two approaches were used to investigate whether different patterns of yield response could be related to different properties of the crop models, specifically their genealogy, calibration and process description.   Although no single model property across a large model ensemble was found to explain the integrated yield response to temperature and precipitation perturbations, the application of the EDA and SDA approaches revealed their capability to distinguish: (i) stronger yield responses to precipitation for winter wheat than spring wheat; (ii) differing strengths of response to climate changes for years with anomalous weather conditions compared to period-average conditions; (iii) the influence of site conditions on yield patterns; (iv) similarities in IRS patterns among models with related genealogy; (v) similarities in IRS patterns for models with simpler process descriptions of root growth and water uptake compared to those with more complex descriptions; and (vi) a closer correspondence of IRS patterns in models using partitioning schemes to represent yield formation than in those using a harvest index.   Such results can inform future crop modelling studies that seek to exploit the diversity of multi-model ensembles, by distinguishing ensemble members that span a wide range of responses as well as those that display implausible behaviour or strong mutual similarities.   The full manuscript of this study is currently under revision (Fronzek et al. 2017).  
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  Notes CropM Approved no  
  Call Number MA @ admin @ Serial 4956  
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Author Rötter, R.P.; Asseng, S.; Ewert, F.; Rosenzweig, C.; Jones, J.W.; Hatfield, J.L.; Basso, B.; Ruane, A.; Boote, K.J.; Thorburn, P.; Brisson, N.; Martre, P.; Aggarwal, P.K.; Angulo, C.; Pertuzzi; Biernath, C.; Challinor, A.J.; Doltra, J.; Gayler, S.; Goldberg, R.; Heng, L.; Hooker, J.; Hunt, L.A.; Ingwersen, J.; Izaurralde, R.C.; Kersebaum, K.-C.; Müller, C.; Kumar, S.N.; Nendel, C.; O’Leary, G.; Olesen, J.E.; Osborne, T.M.; Palosuo, T.; Priesack, E.; Ripoche, D.; Semenov, M.A.; Shcherbak, I.; Steduto, P.; Stöckle, C.; Stratonovitch, P.; Streck, T.; Supit, I.; Tao, F.; Travasso, M.; Waha, K.; Wallach, D.; White, J.W.; Williams, J.R.; Wolf, J. url  openurl
  Title Quantifying Uncertainties in Modeling Crop Water Use under Climate Change Type Conference Article
  Year 2013 Publication Abbreviated Journal  
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  Keywords CropM  
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  Area Expedition Conference Impacts World 2013, International Conference on Climate Change Effects, Potsdam, Germany, 2013-05-27 to 2013-05-30  
  Notes Approved no  
  Call Number MA @ admin @ Serial 2767  
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Author Rötter, R.P.; Höhn, J.K.; Palosuo, T.; Kassie, B.T.; Paff, K.; Tao, F.; Chen, Y.; Asseng, S.; et al. openurl 
  Title Yield gap and variability analysis for different aro-technologies for maize and wheat (YGV study) Type Conference Article
  Year 2015 Publication Abbreviated Journal  
  Volume Issue Pages (down)  
  Keywords CropM;  
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  Publisher Place of Publication Ithaca (U.S.A.) Editor  
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  Area Expedition Conference 2nd Global Food Security Conference, 2015-10-10- to 2015-10-15, Ithaca  
  Notes Approved no  
  Call Number MA @ admin @ Serial 2770  
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Author Wallach, D.; Mearns, L.O.; Asseng, S.; Rötter, R.P. openurl 
  Title Using ensembles of models in climate and crop modelling Type Conference Article
  Year 2014 Publication Abbreviated Journal  
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  Keywords CropM  
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  Area Expedition Conference XIII ESA congress, Debrecen, Hungary, 2014-08-25 to 2014-08-29  
  Notes Approved no  
  Call Number MA @ admin @ Serial 2893  
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