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Author | Title | Year | Publication | Volume | Pages |
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Rötter, R.P.; Höhn, J.K.; Palosuo, T.; Kassie, B.T.; Paff, K.; Tao, F.; Chen, Y.; Asseng, S.; et al. | Yield gap and variability analysis for different aro-technologies for maize and wheat (YGV study) | 2015 | |||
Pirttioja, N.; et al. | Examining wheat yield sensitivity to temperature and precipitation changes for a large ensemble of crop models using impact response surfaces | 2014 |