toggle visibility Search & Display Options

Select All    Deselect All
List View
 |   | 
   print
  Author Title (down) Year Publication Volume Pages Links
Nendel, C.; Wieland, R.; Mirschel, W.; Specka, X.; Guddat, C.; Kersebaum, K.C. Simulating regional winter wheat yields using input data of different spatial resolution 2013 Field Crops Research 145 67-77 details   doi
Graß, R.; Thies, B.; Kersebaum, K.-C.; Wachendorf, M. Simulating dry matter yield of two cropping systems with the simulation model HERMES to evaluate impact of future climate change 2015 European Journal of Agronomy 70 1-10 details   doi
Eitzinger, J.; Thaler, S.; Schmid, E.; Strauss, F.; Ferrise, R.; Moriondo, M.; Bindi, M.; Palosuo, T.; Rotter, R.; Kersebaum, K.C.; Olesen, J.E.; Patil, R.H.; Saylan, L.; Caldag, B.; Caylak, O. Sensitivities of crop models to extreme weather conditions during flowering period demonstrated for maize and winter wheat in Austria 2013 Journal of Agricultural Science 151 813-835 details   doi
Dietrich, J.P.; Popp, A.; Lotze-Campen, H. Reducing the loss of information and gaining accuracy with clustering methods in a global land-use model 2013 Ecological Modelling 263 233-243 details   doi
Ruane, A.C.; Hudson, N.I.; Asseng, S.; Camarrano, D.; Ewert, F.; Martre, P.; Boote, K.J.; Thorburn, P.J.; Aggarwal, P.K.; Angulo, C.; Basso, B.; Bertuzzi, P.; Biernath, C.; Brisson, N.; Challinor, &rew J.; Doltra, J.; Gayler, S.; Goldberg, R.; Grant, R.F.; Heng, L.; Hooker, J.; Hunt, L.A.; Ingwersen, J.; Izaurralde, R.C.; Kersebaum, K.C.; Kumar, S.N.; Müller, C.; Nendel, C.; O’Leary, G.; Olesen, J.E.; Osborne, T.M.; Palosuo, T.; Priesack, E.; Ripoche, D.; Rötter, R.P.; Semenov, M.A.; Shcherbak, I.; Steduto, P.; Stöckle, C.O.; Stratonovitch, P.; Streck, T.; Supit, I.; Tao, F.; Travasso, M.; Waha, K.; Wallach, D.; White, J.W.; Wolf, J. Multi-wheat-model ensemble responses to interannual climate variability 2016 Environmental Modelling & Software 81 86-101 details   doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: