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Balkovič, J.; van der Velde, M.; Schmid, E.; Skalský, R.; Khabarov, N.; Obersteiner, M.; Stürmer, B.; Xiong, W. Pan-European crop modelling with EPIC: Implementation, up-scaling and regional crop yield validation 2013 Agricultural Systems 120 61-75 details   doi
Challinor, A.E.A. How have uncertainties in projected yields changed between AR4 and AR5 2014 details   url
Cezary, S.; Jaromir, K. Institute of Agrophysics PAS and MACSUR presentation 2014 details   openurl
Tao, F.; Zhang, Z.; Zhang, S.; Rötter, R.P. Heat stress impacts on wheat growth and yield were reduced in the Huang-Huai-Hai Plain of China in the past three decades 2015 European Journal of Agronomy 71 44-52 details   doi
Brüser, K. Crop production 2015 details   url
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