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Rötter, R.P.; Höhn, J.K.; Palosuo, T.; Kassie, B.T.; Paff, K.; Tao, F.; Chen, Y.; Asseng, S.; et al. Yield gap and variability analysis for different aro-technologies for maize and wheat (YGV study) 2015 details   openurl
Hoffmann, H.; Zhao, G.; Asseng, S.A.U.-,; Bindi, M.; Cammarano, D.; Constantin, J.; Coucheney, E.; Dechow, R.; Doro, L.; Eckersten, H.; Gaiser, T.; Grosz, B.; Haas, E.; Kassie, B.; Kersebaum, K.C.; Kiese, R.; Klatt, S.; Kuhnert, M.; Lewan, E.; Moriondo, M.; Nendel, C.; Raynal, H.; Roggero, P.P.; Rötter, R.; Siebert, S.; Sosa, C.; Specka, X.; Tao, F.; Teixeira, E.; Trombi, G.; Yeluripati, J.; Vanuytrecht, E.; Wallach, D.; Wang, E.; Weihermüller, L.; Zhao, Z.; Ewert, F. Analysing data aggregation effects on large-scale yield simulations 2016 details   url
Hoffmann, M.P.; Haakana, M.; Asseng, S.; Höhn, J.G.; Palosuo, T.; Ruiz-Ramos, M.; Fronzek, S.; Ewert, F.; Gaiser, T.; Kassie, B.T.; Paff, K.; Rezaei, E.E.; Rodríguez, A.; Semenov, M.; Srivastava, A.K.; Stratonovitch, P.; Tao, F.; Chen, Y.; Rötter, R.P. How does inter-annual variability of attainable yield affect the magnitude of yield gaps for wheat and maize? An analysis at ten sites 2017 Agricultural Systems in press details   doi
Hoffmann, M.P.; Haakana, M.; Asseng, S.; Höhn, J.G.; Palosuo, T.; Ruiz-Ramos, M.; Fronzek, S.; Ewert, F.; Gaiser, T.; Kassie, B.T.; Paff, K.; Rezaei, E.E.; Rodríguez, A.; Semenov, M.; Srivastava, A.K.; Stratonovitch, P.; Tao, F.; Chen, Y.; Rötter, R.P. How does inter-annual variability of attainable yield affect the magnitude of yield gaps for wheat and maize? An analysis at ten sites 2017 Agricultural Systems 159 199-208 details   doi
Webber, H.; Martre, P.; Asseng, S.; Kimball, B.; White, J.; Ottman, M.; Wall, G.W.; De Sanctis, G.; Doltra, J.; Grant, R.; Kassie, B.; Maiorano, A.; Olesen, J.E.; Ripoche, D.; Rezaei, E.E.; Semenov, M.A.; Stratonovitch, P.; Ewert, F. Canopy temperature for simulation of heat stress in irrigated wheat in a semi-arid environment: A multi-model comparison 2017 Field Crops Research 202 21-35 details   doi
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