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Yin, X.; Kersebaum, K.-C.; Beaudoin, N.; Constantin, J.; Chen, F.; Louarn, G.; Manevski, K.; Hoffmann, M.; Kollas, C.; Armas-Herrera, C.M.; Baby, S.; Bindi, M.; Dibari, C.; Ferchaud, F.; Ferrise, R.; de Cortazar-Atauri, I.G.; Launay, M.; Mary, B.; Moriondo, M.; Öztürk, I.; Ruget, F.; Sharif, B.; Wachter-Ripoche, D.; Olesen, J.E. Uncertainties in simulating N uptake, net N mineralization, soil mineral N and N leaching in European crop rotations using process-based models 2020 Field Crops Research 107863 details   doi
Cammarano, D.; Rötter, R.P.; Asseng, S.; Ewert, F.; Wallach, D.; Martre, P.; Hatfield, J.L.; Jones, J.W.; Rosenzweig, C.; Ruane, A.C.; Boote, K.J.; Thorburn, P.J.; Kersebaum, K.C.; Aggarwal, P.K.; Angulo, C.; Basso, B.; Bertuzzi, P.; Biernath, C.; Brisson, N.; Challinor, A.J.; Doltra, J.; Gayler, S.; Goldberg, R.; Heng, L.; Hooker, J.E.; Hunt, L.A.; Ingwersen, J.; Izaurralde, R.C.; Müller, C.; Kumar, S.N.; Nendel, C.; O’Leary, G.; Olesen, J.E.; Osborne, T.M.; Priesack, E.; Ripoche, D.; Steduto, P.; Stöckle, C.O.; Stratonovitch, P.; Streck, T.; Supit, I.; Tao, F.; Travasso, M.; Waha, K.; White, J.W.; Wolf, J. Uncertainty of wheat water use: Simulated patterns and sensitivity to temperature and CO2 2016 Field Crops Research 198 80-92 details   doi
Persson, T.; Höglind, M.; Gustavsson, A.-M.; Halling, M.; Jauhiainen, L.; Niemeläinen, O.; Thorvaldsson, G.; Virkajärvi, P. Evaluation of the LINGRA timothy model under Nordic conditions 2014 Field Crops Research 161 87-97 details   doi
Lizaso, J.I.; Ruiz-Ramos, M.; Rodriguez, L.; Gabaldon-Leal, C.; Oliveira, J.A.; Lorite, I.J.; Rodriguez, A.; Maddonni, G.A.; Otegui, M.E. Modeling the response of maize phenology, kernel set, and yield components to heat stress and heat shock with CSM-IXIM 2017 Field Crops Research 214 239-252 details   doi
Gabaldón-Leal, C.; Webber, H.; Otegui, M.E.; Slafer, G.A.; Ordonez, R.A.; Gaiser, T.; Lorite, I.J.; Ruiz-Ramos, M.; Ewert, F. Modelling the impact of heat stress on maize yield formation 2016 Field Crops Research 198 226-237 details   doi
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